?E effect in amorphous glass covered wires

dc.authorwosidChiriac, Horia/C-4821-2011
dc.contributor.authorSquire, PT
dc.contributor.authorAtalay, S
dc.contributor.authorChiriac, H
dc.date.accessioned2024-08-04T20:12:10Z
dc.date.available2024-08-04T20:12:10Z
dc.date.issued2000
dc.departmentİnönü Üniversitesien_US
dc.descriptionInternational Magnetics Conference (INTERMAG 2000) -- APR 09-12, 2000 -- TORONTO, CANADAen_US
dc.description.abstractAmorphous Fe-Si-B glass-covered and glass-removed wires have been studied in the as-received state and after furnace annealing at 480 degrees C for various times. The M-H loops and magnetic field dependence of Young's modulus measurements have shown that the as-received, glass-covered wire has a single domain configuration with the easy axis parallel to the wire axis. It is suggested that the core-shell domain model applies in annealed, glass-covered and as-received wires after removal of the glass.en_US
dc.identifier.doi10.1109/20.908850
dc.identifier.endpage3435en_US
dc.identifier.issn0018-9464
dc.identifier.issue5en_US
dc.identifier.scopus2-s2.0-0034260871en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.startpage3433en_US
dc.identifier.urihttps://doi.org/10.1109/20.908850
dc.identifier.urihttps://hdl.handle.net/11616/93263
dc.identifier.volume36en_US
dc.identifier.wosWOS:000167371700401en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherIeee-Inst Electrical Electronics Engineers Incen_US
dc.relation.ispartofIeee Transactions on Magneticsen_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectamorphous wireen_US
dc.subjectanisotropyen_US
dc.subjectdomain structureen_US
dc.subjectmagnetoelasticityen_US
dc.title?E effect in amorphous glass covered wiresen_US
dc.typeConference Objecten_US

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