Depth-wise Squeeze and Excitation Block-based Efficient-Unet model for surface defect detection
dc.authorid | Aslan, Muzaffer/0000-0002-2418-9472 | |
dc.authorid | Hanbay, Davut/0000-0003-2271-7865 | |
dc.authorid | UZEN, Huseyin/0000-0002-0998-2130 | |
dc.authorwosid | Aslan, Muzaffer/U-5355-2018 | |
dc.authorwosid | Hanbay, Davut/AAG-8511-2019 | |
dc.authorwosid | UZEN, Huseyin/CZK-0841-2022 | |
dc.contributor.author | Uzen, Huseyin | |
dc.contributor.author | Turkoglu, Muammer | |
dc.contributor.author | Aslan, Muzaffer | |
dc.contributor.author | Hanbay, Davut | |
dc.date.accessioned | 2024-08-04T20:51:49Z | |
dc.date.available | 2024-08-04T20:51:49Z | |
dc.date.issued | 2023 | |
dc.department | İnönü Üniversitesi | en_US |
dc.description.abstract | Detection of surface defects in manufacturing systems is crucial for product quality. Detection of surface defects with high accuracy can prevent financial and time losses. Recently, efforts to develop high-performance automatic surface defect detection systems using computer vision and machine-learning methods have become prominent. In line with this purpose, this paper proposed a novel approach based on Depth-wise Squeeze and Excitation Block-based Efficient-Unet (DSEB-EUNet) for automatic surface defect detection. The proposed model consists of an encoder-decoder, the basic structure of the Unet architecture, and a Depth-wise Squeeze and Excitation Block added to the skip-connection of Unet. First, in the encoder part of the proposed model, low-level and high-level features were obtained by the EfficientNet network. Then, these features were transferred to the Depth-wise Squeeze and Excitation Block. The proposed DSEB based on the combination of Squeeze-Excitation and Depth-wise Separable Convolution enabled to reveal of critical information by weighting the features with a lightweight gating mechanism for surface defect detection. Besides, in the decoder part of the proposed model, the structure called Multi-level Feature Concatenated Block (MFCB) transferred the weighted features to the last layers without losing spatial detail. Finally, pixel-level defect detection was performed using the sigmoid function. The proposed model was tested using three general datasets for surface defect detection. In experimental works, the best F1-scores for MT, DAGM, and AITEX datasets using the proposed DSEB-EUNet architecture were 89.20%, 85.97%, and 90.39%, respectively. These results showed the proposed model outperforms higher performance compared to state-of-the-art approaches. | en_US |
dc.description.sponsorship | Inonu University Scientific Research Projects Coordination [FDK-2021-2725] | en_US |
dc.description.sponsorship | This work was supported by the Inonu University Scientific Research Projects Coordination [Grant Number FDK-2021-2725]. | en_US |
dc.identifier.doi | 10.1007/s00371-022-02442-0 | |
dc.identifier.endpage | 1764 | en_US |
dc.identifier.issn | 0178-2789 | |
dc.identifier.issn | 1432-2315 | |
dc.identifier.issue | 5 | en_US |
dc.identifier.scopus | 2-s2.0-85127403444 | en_US |
dc.identifier.scopusquality | Q2 | en_US |
dc.identifier.startpage | 1745 | en_US |
dc.identifier.uri | https://doi.org/10.1007/s00371-022-02442-0 | |
dc.identifier.uri | https://hdl.handle.net/11616/100581 | |
dc.identifier.volume | 39 | en_US |
dc.identifier.wos | WOS:000776062200002 | en_US |
dc.identifier.wosquality | Q2 | en_US |
dc.indekslendigikaynak | Web of Science | en_US |
dc.indekslendigikaynak | Scopus | en_US |
dc.language.iso | en | en_US |
dc.publisher | Springer | en_US |
dc.relation.ispartof | Visual Computer | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | Pixel-level surface defects' detection | en_US |
dc.subject | Convolutional neural network | en_US |
dc.subject | Depth-wise Squeeze and Excitation Block | en_US |
dc.subject | Unet | en_US |
dc.title | Depth-wise Squeeze and Excitation Block-based Efficient-Unet model for surface defect detection | en_US |
dc.type | Article | en_US |