The Structural and Electrical Characterization of Europium Sulfide Thin Films Prepared with E-Beam Evaporation †

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dc.authorscopusid57200548070
dc.authorscopusid58915380300
dc.authorscopusid36460853400
dc.authorscopusid56042795200
dc.authorscopusid24740982700
dc.authorscopusid7003529624
dc.contributor.authorTasyurek L.B.
dc.contributor.authorDörr F.
dc.contributor.authorErkovan M.
dc.contributor.authorShokr Y.A.
dc.contributor.authorKilinc N.
dc.contributor.authorFumagalli P.
dc.date.accessioned2024-08-04T20:03:47Z
dc.date.available2024-08-04T20:03:47Z
dc.date.issued2023
dc.departmentİnönü Üniversitesien_US
dc.description.abstractIn this study, EuS thin films with varying thicknesses (15, 25, and 50 nm) were deposited onto a Si/SiO2 substrate using e-beam evaporation. Subsequently, two Ag contact electrodes with a 0.2 mm spacing were prepared via thermal evaporation using a shadow mask. To investigate the influence of film thickness and temperature on the electrical properties of EuS thin films, current-voltage (I–V) measurements were performed in a temperature range of 300–433 K for a voltage range of ?2 V to +2 V. The I–V characteristics exhibited a temperature-dependent behavior, particularly showing an increase in current with rising temperature in the forward bias region. Furthermore, an improvement in the Schottky behavior was observed with increasing EuS film thickness. Additionally, the AC electrical and dielectric properties of the EuS thin film were examined in a frequency range of 4 Hz–8 MHz. Capacitance, conductance, impedance, and the Cole–Cole characteristic of EuS were analyzed in detail with respect to frequency, temperature, and film thicknesses. © 2023 by the authors.en_US
dc.identifier.doi10.3390/ASEC2023-15294
dc.identifier.issn2673-4591
dc.identifier.issue1en_US
dc.identifier.scopus2-s2.0-85186442471en_US
dc.identifier.scopusqualityN/Aen_US
dc.identifier.urihttps://doi.org/10.3390/ASEC2023-15294
dc.identifier.urihttps://hdl.handle.net/11616/92085
dc.identifier.volume56en_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherMultidisciplinary Digital Publishing Institute (MDPI)en_US
dc.relation.ispartofEngineering Proceedingsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjecte-beam evaporationen_US
dc.subjectelectrical characterizationen_US
dc.subjectEuSen_US
dc.titleThe Structural and Electrical Characterization of Europium Sulfide Thin Films Prepared with E-Beam Evaporation †en_US
dc.typeArticleen_US

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